Silicon Carbide, Volume 1

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Growth, Defects, and Novel Applications
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Opis książki

This book prestigiously covers our current understanding of SiC as a semiconductor material in electronics. Its physical properties make it more promising for high-powered devices than silicon.<br> The volume is devoted to the material and covers methods of epitaxial and bulk growth. Identification and characterization of defects is discussed in detail. The contributions help the reader to develop a deeper understanding of defects by combining theoretical and experimental approaches. <br> Apart from applications in power electronics, sensors, and NEMS, SiC has recently gained new interest as a substrate material for the manufacture of controlled graphene. SiC and graphene research is oriented towards end markets and has high impact on areas of rapidly growing interest like electric vehicles. <br> The list of contributors reads like a «Who's Who» of the SiC community, strongly benefiting from collaborations between research institutions and enterprises active in SiC crystal growth and device development. <br>

Szczegółowe informacje
Ograniczenie wiekowe:
0+
Data dodania do LitRes:
28 września 2018
Rozmiar:
530 str.
ISBN:
9783527629060
Całkowity rozmiar:
23 MB
Całkowity liczba stron:
530
Rozmiar stron:
170 x 240 мм
Redaktorzy:
Gerhard Pensl, Lothar Ley, Peter Friedrichs, Tsunenobu Kimoto
Wydawca:
Wiley
Prawa autorskie:
John Wiley & Sons Limited
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