Основной контент книги Reliability Wearout Mechanisms in Advanced CMOS Technologies
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Objętość 642 strony
Reliability Wearout Mechanisms in Advanced CMOS Technologies
autorzy
rolf-peter vollertsen,
jordi sune
874,54 zł
O książce
This invaluable resource tells the complete story of failure mechanisms—from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. It also offers the first reference book with all relevant physics, equations, and step-by-step procedures for CMOS technology reliability in one place. Practical appendices provide basic experimental procedures that include experiment design, performing stressing in the laboratory, data analysis, reliability projections, and interpreting projections.
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Ograniczenie wiekowe:
0+Data wydania na Litres:
26 sierpnia 2019Objętość:
642 str. ISBN:
9780470455258Całkowity rozmiar:
8.2 МБCałkowita liczba stron:
642Właściciel praw:
John Wiley & Sons Limited